Dr. Jan-Peter Richters

Jan-Peter Richters received his doctoral degree in physics from the University of Bremen in 2010. Since 2012, he has been working in the metrology development department of Berliner Glas on interferometric data acquisition and computer-based data evaluation. His current scope of work lies in the refinement of interferometric measurement capabilities at Berliner Glas.

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Previously published articles in the Bavarian Journal of Applied Sciences:

Deflectometric Acquisition of Large Optical Surfaces “DaOS” Using a New Physical Measurement Principle: Vignetting Field Stop Procedure (Reprint) (Issue 2 / December 2016)