Manon Schilke has earned a Bachelor’s degree in Applied Physics with a focus on sensor systems at Deggendorf Institute of Technology (DIT). At the moment, she is a technical staff member at Technology Campus Teisnach. Her current area of responsibility in the optical metrology field includes amongst others the development of software and the respective data analyses.
Previously published articles in the Bavarian Journal of Applied Sciences:
Deflectometric Acquisition of Large Optical Surfaces “DaOS” Using a New Physical Measurement Principle: Vignetting Field Stop Procedure (Reprint) (Issue 2 / December 2016)